Many of the techniques developed for depositing thin films take advantage of the sputter phenomenon. The main system used by these techniques consists of a pair of planar electrodes, the anode where the substrate (e.g. silicon wafer) is placed, and the cathode (target) that is made up of the material that will be used for the thin film deposition onto the substrate. The two electrodes are located inside the low pressure vacuum deposition chamber (~0,1 Torr). This is a chamber filled with the sputtering gas, usually an inert gas such as Argon (Ar).
Once negative voltage is applied to the target surface, any existing Ar positive ions will accelerate towards the cathode and after falling on it, a small stream of atoms or clusters of atoms will eject from the cathode material. A small portion of them will impact on the anode's wafer, leading to the formation of a thin film onto the substrate. In order to keep the process going, constant gas ionizations are necessary and this is achieved with the aid of the secondary electrons that collide with neutral atoms and generate new ions.
The sputter yield S is provided by the following equation:
S = (atoms removed)/ (incident ions)
and is highly dependent on the:
- incident ion's energy,
- target material,
- incidence angle and
- target structure.